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Advanced Surface Microscopy Inc

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3250 N POST RD STE 120 INDIANAPOLIS, IN 46226 Get Directions

(317) 895-5630

www.asmicro.com

Business Info

  • Founded 1990
  • Incorporated IN
  • Annual Revenue $600,000.00
  • Employee Count 2
  • Industries Testing Laboratories
  • Contacts Donald Chernoff

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Company Summary

Advanced Surface Microscopy, Inc. is an independent analytical/contract research laboratory. We are dedicated to providing outstanding analytical services, research and consulting to developers, producers and users of advanced materials and devices.


Our Staff:

All technical work is supervised by Dr. Donald A. Chernoff. Dr. Chernoff holds a Ph.D. in Physical Chemistry (University of Chicago) and has about 25 years industrial research experience; he has been active in the field of scanning probe microscopy since its development in 1986. His significant contributions in the area of laser spectroscopy and optics, electron microscopy and the practical application of microscopy to process improvement have resulted in over 40 publications and patents.
David Burkhead, has a B.S. in Physics (University of Akron) and has been providing distinguished SPM analysis and software development at ASM since 1997.

Our Experience:

Any surface that you can touch can, in theory, be examined by the AFM. Since 1990, we have provided more than 1000 analytical projects for more than 200 customers, examining more than 100 types of materials and devices.

We are especially proud of two contributions to microscopy and materials analysis:

In November 1994, ASM became the first lab outside of Digital Instruments to make a tapping mode phase image and to recognize that it was important for materials analysis in general. ASM was the lone proponent of this new technique for about 1 year and pioneered many applications of phase imaging.
ASM invented a general method for making high precision and high accuracy measurements from images such as AFM images. Patents were issued in 1997 and 1998. DiscTrack PlusTM is based on this invention and quickly became the gold standard for measuring track pitch variation in optical discs.

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